1μm-thickness 64-channel surface electromyogram measurement sheet with 2V organic transistors for prosthetic hand control

Hiroshi Fuketa, Kazuaki Yoshioka, Yasuhiro Shinozuka, Koichi Ishida, Tomoyuki Yokota, Naoji Matsuhisa, Yusuke Inoue, Masaki Sekino, Tsuyoshi Sekitani, Makoto Takamiya, Takao Someya, Takayasu Sakurai

研究成果: Conference contribution

21 被引用数 (Scopus)

抄録

A surface electromyogram (EMG), which measures a voltage waveform produced by skeletal muscles on skin, is an important tool for applications detecting the human will of motion, such as for prosthetic hands and prosthetic legs. In the application to a prosthetic hand, a multipoint EMG measurement is required to precisely control the hand [1, 2]. Conventional multipoint measurements with a passive electrode array [1-3], however, have two problems: 1) Measurement over a long time period is annoying, because the EMG electrodes placed on the skin are rigid, and 2) the signal integrity of EMG is degraded, because the number of wires between the electrodes and the front-end circuits increases with increasing number of measurement points. To address these challenges, a surface EMG measurement sheet (SEMS) on which an EMG electrode array and a front-end amplifier array with 2V organic transistors are integrated on a 1μm-thick ultra-flexible film is developed to control prosthetic hands. The developed SEMS enables a comfortable long-time measurement without signal integrity degradation.

本文言語English
ホスト出版物のタイトル2013 IEEE International Solid-State Circuits Conference, ISSCC 2013 - Digest of Technical Papers
ページ104-105
ページ数2
DOI
出版ステータスPublished - 2013
外部発表はい
イベント2013 60th IEEE International Solid-State Circuits Conference, ISSCC 2013 - San Francisco, CA, United States
継続期間: 2013 2月 172013 2月 21

出版物シリーズ

名前Digest of Technical Papers - IEEE International Solid-State Circuits Conference
56
ISSN(印刷版)0193-6530

Other

Other2013 60th IEEE International Solid-State Circuits Conference, ISSCC 2013
国/地域United States
CitySan Francisco, CA
Period13/2/1713/2/21

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 電子工学および電気工学

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