抄録
X-ray computed tomography is used in many situations, for example medicine and inspection of industrial products. Recently, the whole system of computed tomography gets smaller, and it is effective for nondestructive inspection. But there are some problems when we want to get the image of flat objects, namely rate of expansion and contrast. This study aims at solving these problems by Diagonal X-ray computed tomography system.
| 本文言語 | English |
|---|---|
| ページ | 640-643 |
| ページ数 | 4 |
| 出版ステータス | Published - 2005 12月 1 |
| イベント | SICE Annual Conference 2005 - Okayama, Japan 継続期間: 2005 8月 8 → 2005 8月 10 |
Other
| Other | SICE Annual Conference 2005 |
|---|---|
| 国/地域 | Japan |
| City | Okayama |
| Period | 05/8/8 → 05/8/10 |
ASJC Scopus subject areas
- 制御およびシステム工学
- コンピュータ サイエンスの応用
- 電子工学および電気工学