A 0.7V 12b 160MS/s 12.8fJ/conv-step pipelined-SAR ADC in 28nm CMOS with digital amplifier technique

Kentaro Yoshioka, Tomohiko Sugimoto, Naoya Waki, Sinnyoung Kim, Daisuke Kurose, Hirotomo Ishii, Masanori Furuta, Akihide Sai, Tetsuro Itakura

研究成果: Conference contribution

26 被引用数 (Scopus)

抄録

Wireless standards, e.g. 802.11ac Wave 2 and 802.11ax draft, aim to boost user throughput to cope with growing data traffic. High-speed (fs>100MS/s) and high-resolution (ENOB>9.5b) ADCs are essential for leading-edge wireless SoCs, given the bandwidth and PAPR specifications. Also, low power dissipation (FoM<20fJ/conv) is crucial for mobile applications. A number of pipelined-SAR ADCs have been presented which satisfy these design targets [1-3]. However, in deep submicron CMOS, design of a high DC-gain opamp for the MDAC is a serious obstacle due to reduced intrinsic transistor gain and sub-1V supply voltage. Hence, all designs utilize digital calibration to counter gain error and tolerate the use of a low-gain amplifier. Calibration times of at least several tens of ms are required, resulting in lengthy start-up times and reduced SoC power efficiency. Moreover, such calibration cannot track sudden supply voltage variations and suppressing such fluctuations with bypass capacitors significantly impacts chip cost [1-2]. Furthermore, amplifier non-linearity remains unsolved; with lower supply voltages, the limited amplifier swing tightens SAR noise requirements.

本文言語English
ホスト出版物のタイトル2017 IEEE International Solid-State Circuits Conference, ISSCC 2017
編集者Laura C. Fujino
出版社Institute of Electrical and Electronics Engineers Inc.
ページ478-479
ページ数2
ISBN(電子版)9781509037575
DOI
出版ステータスPublished - 2017 3月 2
外部発表はい
イベント64th IEEE International Solid-State Circuits Conference, ISSCC 2017 - San Francisco, United States
継続期間: 2017 2月 52017 2月 9

出版物シリーズ

名前Digest of Technical Papers - IEEE International Solid-State Circuits Conference
60
ISSN(印刷版)0193-6530

Conference

Conference64th IEEE International Solid-State Circuits Conference, ISSCC 2017
国/地域United States
CitySan Francisco
Period17/2/517/2/9

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 電子工学および電気工学

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