A correction method for the determination of low atomic number elements in aerosols by XRF analysis by using an intensity ratio between Compton and Thomson scattering
Tanaka Shigeru, Katsutaka Okamori, Yoshikazu Hashimoto, Souichi Sato
「A correction method for the determination of low atomic number elements in aerosols by XRF analysis by using an intensity ratio between Compton and Thomson scattering」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。