A digital-to-resistance converter with an automatic offset calibration method for evaluating dynamic performance of resistive sensor readout circuits

Shuya Nakagawa, Takumi Miyazaki, Hiroki Ishikuro

研究成果: Conference contribution

抄録

In this paper, a digital-to-resistance converter (DRC) with automatic offset calibration circuits is proposed. This circuit is used to evaluate the dynamic performance of resistive sensor readout circuits. The proposed DRC consists of a digital-to-analog converter, an analog multiplier, a fixed-value reference resistor, and current sources. A wide-range resistance changing at high frequency is achieved with the proposed DRC. In order to minimize the resistance error caused by the offset voltage of op-amps, an automatic offset calibration method is proposed. This developed prototype DRC achieved 96.3 dB dynamic range, 56.1 dB SNDR at 10kHz, and a maximum operating frequency is 100kHz.

本文言語English
ホスト出版物のタイトルI2MTC 2020 - International Instrumentation and Measurement Technology Conference, Proceedings
出版社Institute of Electrical and Electronics Engineers Inc.
ISBN(電子版)9781728144603
DOI
出版ステータスPublished - 2020 5
イベント2020 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2020 - Dubrovnik, Croatia
継続期間: 2020 5 252020 5 29

出版物シリーズ

名前I2MTC 2020 - International Instrumentation and Measurement Technology Conference, Proceedings

Conference

Conference2020 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2020
CountryCroatia
CityDubrovnik
Period20/5/2520/5/29

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Instrumentation

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