TY - JOUR
T1 - A method for evaluations on the radiation trapping in an inductively coupled plasma in argon
AU - Scharwitz, Christian
AU - Makabe, Toshiaki
PY - 2009/12/28
Y1 - 2009/12/28
N2 - One of the general challenges for the evaluation and interpretation of optical emission spectroscopy measurements is the occurrence of radiation trapping, which is also named self-absorption or opacity. A convenient technique to treat radiation trapping is the introduction of a parameter, which is called escape factor and gives a measure for the amount of radiation trapping. In this paper evaluations on the concept of escape factors are presented for an inductively coupled plasma in argon. Especially, the strong argon line at 811.53 nm, which arises from the transition of 2p9-1s5, is under consideration. To estimate escape factors for this line, a particular method is proposed and presented here. First experimental results are obtained under the restrictive assumptions that transitions into the resonant levels 1s2 and 1s4 are sufficiently optically thin and ratios of population densities are constant.
AB - One of the general challenges for the evaluation and interpretation of optical emission spectroscopy measurements is the occurrence of radiation trapping, which is also named self-absorption or opacity. A convenient technique to treat radiation trapping is the introduction of a parameter, which is called escape factor and gives a measure for the amount of radiation trapping. In this paper evaluations on the concept of escape factors are presented for an inductively coupled plasma in argon. Especially, the strong argon line at 811.53 nm, which arises from the transition of 2p9-1s5, is under consideration. To estimate escape factors for this line, a particular method is proposed and presented here. First experimental results are obtained under the restrictive assumptions that transitions into the resonant levels 1s2 and 1s4 are sufficiently optically thin and ratios of population densities are constant.
UR - http://www.scopus.com/inward/record.url?scp=72449205517&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=72449205517&partnerID=8YFLogxK
U2 - 10.1063/1.3262566
DO - 10.1063/1.3262566
M3 - Article
AN - SCOPUS:72449205517
VL - 106
JO - Journal of Applied Physics
JF - Journal of Applied Physics
SN - 0021-8979
IS - 11
M1 - 113304
ER -