A New Method for Detecting the Contact Point between a Touch Probe and a Surface

H. Aoyama, M. Kawai, T. Kishinami, N. Taniguchi

研究成果: Article査読

45 被引用数 (Scopus)

抄録

This paper deals with a newly developed touch probe which can directly detect the point between the surface of an object being measured and itself. The proposed method is based on the spherical potentiometer; that is, the probe ball is covered with a thin resistant film and four electrodes are symmetrically allocated on the upper part of the probe ball. By measuring the electric resistance between the four electrodes and the contact point, it is possible to determine where the point of contact is located on the probe ball. This paper describes the computer simulation for designing the probe, the development of the probe based on this principle, the system of measurement using the probe and a coordinate measuring machine, and an evaluation of the developed probe according to the results of experiments.

本文言語English
ページ(範囲)517-520
ページ数4
ジャーナルCIRP Annals - Manufacturing Technology
38
1
DOI
出版ステータスPublished - 1989
外部発表はい

ASJC Scopus subject areas

  • 機械工学
  • 産業および生産工学

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