A soft X-ray beamline for surface chemistry at the Photon Factory

Kenta Amemiya, Hiroshi Kondoh, Toshihiko Yokoyama, Toshiaki Ohta

研究成果: Article査読

81 被引用数 (Scopus)

抄録

A new soft X-ray (50-1500 eV) beamline has been constructed at a bending magnet station at the Photon Factory in order to perform photoemission spectroscopy (PES), X-ray absorption fine structure (XAFS), photoelectron diffraction (PED) and X-ray magnetic circular dichroism (XMCD) experiments in surface chemistry. Approximately 1011 photons/s can be obtained with a medium resolution (E/ΔE∼1000), while E/ΔE∼8000 can be attained at the N K edge with a photon flux of ∼109 photons/s. In addition to conventional XAFS, a novel technique 'energy dispersive NEXAFS (near-edge X-ray absorption fine structure)' has been successfully developed. The performance of the new beamline is reported and typical examples of its application to surface chemistry are demonstrated.

本文言語English
ページ(範囲)151-164
ページ数14
ジャーナルJournal of Electron Spectroscopy and Related Phenomena
124
2-3
DOI
出版ステータスPublished - 2002 7 1
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 放射線
  • 原子分子物理学および光学
  • 凝縮系物理学
  • 分光学
  • 物理化学および理論化学

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