The diffraction color problem on diamond turned surfaces was considered from diffraction theory and light scattering using Atomic Force Microscopy measurements. This simple theory explains the diffraction color appearance based on the incident light angle and pattern pitch on the surface. High lateral resolution data can accurately characterize the surface and Total Integrated Scattering (TIS) can be used to estimate the diffraction color problem.
|出版ステータス||Published - 2020|
|イベント||35th Annual Meeting of the American Society for Precision Engineering, ASPE 2020 - Virtual, Online|
継続期間: 2020 10 20 → 2020 10 22
|Conference||35th Annual Meeting of the American Society for Precision Engineering, ASPE 2020|
|Period||20/10/20 → 20/10/22|
ASJC Scopus subject areas