A study validating the estimation of anterior chamber depth and iridocorneal angle with portable and non-portable slit-lamp microscopy

Eisuke Shimizu, Hiroyuki Yazu, Naohiko Aketa, Ryota Yokoiwa, Shinri Sato, Junichiro Yajima, Taiichiro Katayama, Rio Sato, Makoto Tanji, Yasunori Sato, Yoko Ogawa, Kazuo Tsubota

研究成果: Article査読

3 被引用数 (Scopus)

抄録

This study assessed the anterior chamber depth (ACD) and iridocorneal angle using a portable smart eye camera (SEC) compared to the conventional slit-lamp microscope and anterior-segment optical coherence tomography (AS-OCT). This retrospective case-control study included 170 eyes from 85 Japanese patients. The correlation between the ACD evaluations conducted with the SEC and conventional slit-lamp was high (r = 0.814). The correlation between the Van-Herick Plus grade obtained using two devices was also high (r = 0.919). A high kappa value was observed for the Van-Herick Plus grading (Kappa = 0.757). A moderate correlation was observed between the ACD measured using AS-OCT and the slit-lamp image acquired with the conventional slit-lamp microscope and SEC (r = 0.609 and 0.641). A strong correlation was observed between the trabecular-iris angle (TIA) measured using AS-OCT and Van-Herick Plus grade obtained with the conventional slit-lamp microscope and SEC (r = 0.702 and 0.764). Strong correlations of ACD evaluation and high kappa value of the Van-Herick Plus grading indicated the adequate subjective assessment function of the SEC. Moderate correlations between the ACD objective measurement and evaluation and strong correlation between the TIA and Van-Herick Plus grade suggested the good objective assessment function of the SEC. The SEC demonstrated adequate performance for ACD evaluation and angle estimation.

本文言語English
論文番号1436
ページ(範囲)1-11
ページ数11
ジャーナルSensors
21
4
DOI
出版ステータスPublished - 2021 2 2

ASJC Scopus subject areas

  • Analytical Chemistry
  • Information Systems
  • Atomic and Molecular Physics, and Optics
  • Biochemistry
  • Instrumentation
  • Electrical and Electronic Engineering

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