TY - JOUR
T1 - Advanced linear encoder calibration system with sub-nanometer resolution
AU - Taniguchi, Kayoko
AU - Tamiya, Hideaki
AU - Enomoto, Tsutomu
AU - Aoyama, Hideaki
AU - Yamazaki, Kazuo
N1 - Publisher Copyright:
© 2020 CIRP
PY - 2020
Y1 - 2020
N2 - Calibration of linear encoders has conventionally been performed using an optical interferometer for reference. Calibration using the optical interferometer, however, cannot fulfill the accuracy and stability requirements when the linear encoders exhibit sub-nanometer resolution. This study describes a new calibration method developed using the picometer resolution laser holographic scale as a reference, employing a range-dependent and minimum error-variance algorithm. The method has been evaluated via comparison tests with conventional optical-interferometer-based methods. Moreover, it has also been verified to achieve higher resolution, accuracy, and higher stability during the measurements, even in the atmospheric environment.
AB - Calibration of linear encoders has conventionally been performed using an optical interferometer for reference. Calibration using the optical interferometer, however, cannot fulfill the accuracy and stability requirements when the linear encoders exhibit sub-nanometer resolution. This study describes a new calibration method developed using the picometer resolution laser holographic scale as a reference, employing a range-dependent and minimum error-variance algorithm. The method has been evaluated via comparison tests with conventional optical-interferometer-based methods. Moreover, it has also been verified to achieve higher resolution, accuracy, and higher stability during the measurements, even in the atmospheric environment.
KW - Calibration
KW - Encoder
KW - Sub-nanometer
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U2 - 10.1016/j.cirp.2020.04.064
DO - 10.1016/j.cirp.2020.04.064
M3 - Article
AN - SCOPUS:85084767377
SN - 0007-8506
VL - 69
SP - 437
EP - 440
JO - CIRP Annals - Manufacturing Technology
JF - CIRP Annals - Manufacturing Technology
IS - 1
ER -