Advanced linear encoder calibration system with sub-nanometer resolution

Kayoko Taniguchi, Hideaki Tamiya, Tsutomu Enomoto, Hideaki Aoyama, Kazuo Yamazaki

研究成果: Article査読

抄録

Calibration of linear encoders has conventionally been performed using an optical interferometer for reference. Calibration using the optical interferometer, however, cannot fulfill the accuracy and stability requirements when the linear encoders exhibit sub-nanometer resolution. This study describes a new calibration method developed using the picometer resolution laser holographic scale as a reference, employing a range-dependent and minimum error-variance algorithm. The method has been evaluated via comparison tests with conventional optical-interferometer-based methods. Moreover, it has also been verified to achieve higher resolution, accuracy, and higher stability during the measurements, even in the atmospheric environment.

本文言語English
ページ(範囲)437-440
ページ数4
ジャーナルCIRP Annals
69
1
DOI
出版ステータスPublished - 2020

ASJC Scopus subject areas

  • 機械工学
  • 産業および生産工学

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