### 抜粋

Analytical techniques related to the Markov chain are utilized to study the capacity and recall probability of Hebbian-type associative memory (HAM). The concept is based on the analogy between the Markov chain and the asynchronous iterative memory recall process of HAM. Calculation of the limiting zero state probability of a birth-death process of incorrect bits of the probe leads to a faithful estimation of the recall probability for a given HAM. Results obtained show a strong resemblance to those obtained by J. J. Hopfield (1982). However, time-consuming computational simulation requirements can be avoided by the proposed method. Moreover, it has been shown that the recall probability of a given HAM is independent of the initial Hamming distance between the probe and the nearest memory state as the number of asynchronous recall iterations tends to infinity.

元の言語 | English |
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ホスト出版物のタイトル | 1991 IEEE International Joint Conference on Neural Networks |

出版者 | Publ by IEEE |

ページ | 13-18 |

ページ数 | 6 |

ISBN（印刷物） | 0780302273 |

出版物ステータス | Published - 1992 12 1 |

外部発表 | Yes |

イベント | 1991 IEEE International Joint Conference on Neural Networks - IJCNN '91 - Singapore, Singapore 継続期間: 1991 11 18 → 1991 11 21 |

### 出版物シリーズ

名前 | 1991 IEEE International Joint Conference on Neural Networks |
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### Other

Other | 1991 IEEE International Joint Conference on Neural Networks - IJCNN '91 |
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市 | Singapore, Singapore |

期間 | 91/11/18 → 91/11/21 |

### ASJC Scopus subject areas

- Engineering(all)

## フィンガープリント Analogy between Markov chain and the asynchronous memory recall process of Hebbian-type associative memory' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

## これを引用

*1991 IEEE International Joint Conference on Neural Networks*(pp. 13-18). (1991 IEEE International Joint Conference on Neural Networks). Publ by IEEE.