Analysis and evaluation of electromagnetic interference between ThruChip interface and LC-VCO

Junichiro Kadomoto, So Hasegawa, Yusuke Kiuchi, Atsutake Kosuge, Tadahiro Kuroda

    研究成果: Article査読

    1 被引用数 (Scopus)

    抄録

    This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.

    本文言語English
    ページ(範囲)659-662
    ページ数4
    ジャーナルIEICE Transactions on Electronics
    E99C
    6
    DOI
    出版ステータスPublished - 2016 6

    ASJC Scopus subject areas

    • 電子材料、光学材料、および磁性材料
    • 電子工学および電気工学

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