Analysis and evaluation of electromagnetic interference between ThruChip interface and LC-VCO

Junichiro Kadomoto, So Hasegawa, Yusuke Kiuchi, Atsutake Kosuge, Tadahiro Kuroda

    研究成果: Article

    1 引用 (Scopus)

    抜粋

    This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.

    元の言語English
    ページ(範囲)659-662
    ページ数4
    ジャーナルIEICE Transactions on Electronics
    E99C
    発行部数6
    DOI
    出版物ステータスPublished - 2016 6 1

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering

    フィンガープリント Analysis and evaluation of electromagnetic interference between ThruChip interface and LC-VCO' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用