This paper discusses analysis and techniques for mitigating interference of an inductive-coupling inter-chip link. Electromagnetic interference from power/signal lines and to SRAM circuits was simulated and measured. In order to verify the interference, test chips were designed and fabricated using 65-nm CMOS technology. The measurement results revealed that: 1) interference from power lines depends on the shape of the power lines; 2) interference from signal lines can be canceled by increasing transmitter power by only 9%; and 3) interference with SRAM circuits is less important than other issues under ordinary conditions. Based on the measurement results, interference mitigation techniques are proposed and investigated.
|ジャーナル||IEEE Transactions on Very Large Scale Integration (VLSI) Systems|
|出版ステータス||Published - 2011 10月|
ASJC Scopus subject areas