Assessment of liquid crystal display image defects by pixel capacitance measurement based on electrical model for panel design

Yasuhiro Miyake, Atsuto Ota, Hidekazu Nishimura

研究成果: Conference contribution

抄録

This article proposes the assessment of liquid crystal display (LCD) image defects based on electrical models which are also used for the design of liquid crystal (LC) cell panels. The effects of image defects on a LC pixel electrical model are analyzed, and the test method for assessing image defects using the electrical model is provided. Experimental results show the validity of the analysis and effectiveness of the proposed test method.

本文言語English
ホスト出版物のタイトルEuroDisplay 2015
出版社Blackwell Publishing Ltd
ページ71
ページ数1
ISBN(電子版)9781510833104
DOI
出版ステータスPublished - 2015
イベントEuroDisplay 2015 Conference - Ghent, Belgium
継続期間: 2015 9 212015 9 23

出版物シリーズ

名前Digest of Technical Papers - SID International Symposium
46
ISSN(印刷版)0097-966X
ISSN(電子版)2168-0159

Other

OtherEuroDisplay 2015 Conference
国/地域Belgium
CityGhent
Period15/9/2115/9/23

ASJC Scopus subject areas

  • 工学(全般)

フィンガープリント

「Assessment of liquid crystal display image defects by pixel capacitance measurement based on electrical model for panel design」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル