Bayes estimator of process capability index Cpk with a specified prior mean

研究成果: Article査読

1 被引用数 (Scopus)

抄録

Process capability indices such as Cp, CpL, CpU, and Cpk have been used for evaluating the performance of a manufacturing process in statistical quality control and statistical process control fields. In this paper, a Bayes estimator of Cpk is constructed such that the prior mean is set to be equal to a specified value while the prior distribution is weakly informative. This estimator is compared with conventional Bayes and non Bayes estimators.

本文言語English
ジャーナルCommunications in Statistics - Theory and Methods
DOI
出版ステータスAccepted/In press - 2021

ASJC Scopus subject areas

  • 統計学および確率

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