Break even time analysis using empirical overhead parameters for embedded systems on SOTB technology

研究成果: Conference contribution

2 引用 (Scopus)

抜粋

It is essential for any embedded systems and increasing popularity of Internet of Things (IoT) be energy efficient. Such systems tend to work intermittently and reducing leakage in the idle time is essential. Energy reduction techniques bring the system to a low power mode which also provokes transition overheads. If such overheads are not considered, the task may not be schedulable under a given deadline. To get a gain in energy savings, the idle state must be longer than a minimum required time. This time is referred as Break Even Time (BET). To properly design efficient algorithms and schedulers we must calculate and include the BET. In this paper, we present the first studies to examine the BET using accurate parameters extracted from a real chip using Silicon On Thin Box (SOTB) technology employing Body Bias Control (BB) energy saving technique. In this study, we demonstrate the BET range for SOTB microcontrollers, on the order of 0.5ms up to 1ms.

元の言語English
ホスト出版物のタイトル2017 32nd Conference on Design of Circuits and Integrated Systems, DCIS 2017 - Proceedings
出版者Institute of Electrical and Electronics Engineers Inc.
ページ1-6
ページ数6
2017-November
ISBN(電子版)9781538651087
DOI
出版物ステータスPublished - 2018 3 9
イベント32nd Conference on Design of Circuits and Integrated Systems, DCIS 2017 - Barcelona, Spain
継続期間: 2017 11 222017 11 24

Other

Other32nd Conference on Design of Circuits and Integrated Systems, DCIS 2017
Spain
Barcelona
期間17/11/2217/11/24

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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  • これを引用

    Cortes, C., Amano, H., & Yamasaki, N. (2018). Break even time analysis using empirical overhead parameters for embedded systems on SOTB technology. : 2017 32nd Conference on Design of Circuits and Integrated Systems, DCIS 2017 - Proceedings (巻 2017-November, pp. 1-6). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DCIS.2017.8311633