Cantilever with 10-fold tunable spring constant using Lorentz force

W. Ohnishi, Hidetoshi Takahashi, T. Takahata, K. Matsumoto, I. Shimoyama

研究成果: Conference contribution

1 引用 (Scopus)

抜粋

This paper reports a cantilever with 10-fold tunable spring constant. The spring constant can be tuned both larger and smaller using Lorentz force generated by direct current which flows through the wiring on the cantilever. We designed the cantilever so that the maximum spring constant change by Lorentz force can be the same order as initial spring constant. The change of the spring constant was evaluated from the resonant frequency shift. The experimental result shows that the resonant frequency can be controlled from 1.1 kHz to 3.8 kHz, and the ratio of the tuned spring constant to the initial value was evaluated to be from 0.22 to 2.6.

元の言語English
ホスト出版物のタイトルMEMS 2016 - 29th IEEE International Conference on Micro Electro Mechanical Systems
出版者Institute of Electrical and Electronics Engineers Inc.
ページ866-868
ページ数3
ISBN(電子版)9781509019731
DOI
出版物ステータスPublished - 2016 2 26
外部発表Yes
イベント29th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2016 - Shanghai, China
継続期間: 2016 1 242016 1 28

出版物シリーズ

名前Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
2016-February
ISSN(印刷物)1084-6999

Other

Other29th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2016
China
Shanghai
期間16/1/2416/1/28

    フィンガープリント

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Mechanical Engineering
  • Electrical and Electronic Engineering

これを引用

Ohnishi, W., Takahashi, H., Takahata, T., Matsumoto, K., & Shimoyama, I. (2016). Cantilever with 10-fold tunable spring constant using Lorentz force. : MEMS 2016 - 29th IEEE International Conference on Micro Electro Mechanical Systems (pp. 866-868). [7421767] (Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS); 巻数 2016-February). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MEMSYS.2016.7421767