Cation sublattice stacking faults in Cu-rich chalcopyrite CuInSe2

Olof Hellman, Shun Ichiro Tanaka, Shigeru Niki, Paul Fons

研究成果: Article査読

4 被引用数 (Scopus)

抄録

Using transmission electron microscopy, we have found stacking faults on the cation sublattice in the chalcopyrite structure of CuInSe2. These films are grown by molecular beam epitaxy under Cu-rich conditions. These stacking faults are found to extend large distances in the plane of the film, and are not found to be present in samples not grown in Cu-rich conditions. We suggest that this defect is triggered by a Cu-induced transformation of the surface structure of the growing film.

本文言語English
ページ(範囲)1398-1402
ページ数5
ジャーナルJournal of Materials Research
11
6
DOI
出版ステータスPublished - 1996 6
外部発表はい

ASJC Scopus subject areas

  • 材料科学(全般)
  • 凝縮系物理学
  • 材料力学
  • 機械工学

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