Characterization and control of femtosecond localized plasmon using spectral interferometry with SNOM or fringe-resolved autocorrelation with dark-field microscopy

Fumihiko Kannari, Keiichiro Matsuishi, Takuya Harada, Jun Ohi, Yu Oishi

    研究成果: Conference contribution

    1 被引用数 (Scopus)

    抄録

    We apply two nova methods, a spectral interferometry with NSOM, and fringe-resolved-autocorrelation with dark-field microscopy in the spatio-temporal characterization of femtosecond localized plasmon at metal nanostructures. Spatio-temporal plasmon control is studied using these diagnostics.

    本文言語English
    ホスト出版物のタイトルECOC 2010 - 36th European Conference and Exhibition on Optical Communication, Proceedings
    DOI
    出版ステータスPublished - 2010 12 31
    イベント36th European Conference and Exhibition on Optical Communication, ECOC 2010 - Torino, Italy
    継続期間: 2010 9 192010 9 23

    出版物シリーズ

    名前European Conference on Optical Communication, ECOC
    1-2

    Other

    Other36th European Conference and Exhibition on Optical Communication, ECOC 2010
    国/地域Italy
    CityTorino
    Period10/9/1910/9/23

    ASJC Scopus subject areas

    • 電子工学および電気工学
    • 電子材料、光学材料、および磁性材料

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