TY - JOUR
T1 - Classifying patents based on their semantic content
AU - Bergeaud, Antonin
AU - Potiron, Yoann
AU - Raimbault, Juste
N1 - Publisher Copyright:
© 2017 Bergeaud et al. This is an open access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.
PY - 2017/4
Y1 - 2017/4
N2 - In this paper, we extend some usual techniques of classification resulting from a large-scale data-mining and network approach. This new technology, which in particular is designed to be suitable to big data, is used to construct an open consolidated database from raw data on 4 million patents taken from the US patent office from 1976 onward. To build the pattern network, not only do we look at each patent title, but we also examine their full abstract and extract the relevant keywords accordingly. We refer to this classification as semantic approach in contrast with the more common technological approach which consists in taking the topology when considering US Patent office technological classes. Moreover, we document that both approaches have highly different topological measures and strong statistical evidence that they feature a different model. This suggests that our method is a useful tool to extract endogenous information.
AB - In this paper, we extend some usual techniques of classification resulting from a large-scale data-mining and network approach. This new technology, which in particular is designed to be suitable to big data, is used to construct an open consolidated database from raw data on 4 million patents taken from the US patent office from 1976 onward. To build the pattern network, not only do we look at each patent title, but we also examine their full abstract and extract the relevant keywords accordingly. We refer to this classification as semantic approach in contrast with the more common technological approach which consists in taking the topology when considering US Patent office technological classes. Moreover, we document that both approaches have highly different topological measures and strong statistical evidence that they feature a different model. This suggests that our method is a useful tool to extract endogenous information.
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U2 - 10.1371/journal.pone.0176310
DO - 10.1371/journal.pone.0176310
M3 - Article
C2 - 28445550
AN - SCOPUS:85018166764
SN - 1932-6203
VL - 12
JO - PLoS One
JF - PLoS One
IS - 4
M1 - e0176310
ER -