Comparison with transient measurements of infrared radiation and stress wave for the practical ablation monitoring during photorefractive keratectomy

Miya Ishihara, Tsunenori Arai, Makoto Kikuchi, Hironori Nakano, Satoko Kawauchi, Minoru Obara

研究成果: Conference article査読

抄録

We compared infrared radiation measurement with stress wave measurement for real-time ablation monitoring during photorefractive keratectomy (PRK). We estimated temperature elevation which may be one of the most effective parameter for PRK monitoring, because the ablation mechanism is mainly attributed to thermal kinetics. The temperature elevation of ablated cornea was evaluated by the infrared radiation and the stress wave. The thermal radiation from irradiated cornea was detected by a MCT detector. The measured signal increased sharply just after the laser irradiation and decreased quasi-exponentially. We could calculate the temperature elevation by observed signal using Stefan-Boltzmann radiation law. In the case of the gelatin gel (15%wt) ablation in vitro, the temperature elevation was 97deg. at 208mJ/cm2 in the laser fluence. We also measured transient stress wave by the acoustic transducer which was made by polyvinylidene fluoride (PVDF) film. The temperature elevation could be calculated from the peak stress amplitude based on the short pulsed laser ablation theory. The good agreement on the temperature elevation was obtained between the infrared and the stress based estimations. Due to non-contact and non-invasive method, our infrared measurements for temperature elevation monitoring may be available to accomplish the feedback control on the PRK.

本文言語English
ページ(範囲)319-324
ページ数6
ジャーナルProceedings of SPIE - The International Society for Optical Engineering
3254
DOI
出版ステータスPublished - 1998 12 1
イベントLaser-Tissue Interaction IX - San Jose, CA, United States
継続期間: 1998 1 261998 1 28

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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