TY - GEN
T1 - Correlation-based model of color picture watermarking against random geometric distortion
AU - Echizen, Isao
AU - Fujii, Yasuhiro
AU - Yamada, Takaaki
AU - Tezuka, Satoru
AU - Yoshiura, Hiroshi
PY - 2005/12/1
Y1 - 2005/12/1
N2 - Random geometric distortion is one of the most difficult kinds of image processing to survive and has been a noted problem in watermarking research. Previous methods for dealing with random geometric distortion, however, are accompanied by large computational overhead or by operational inconvenience. This paper therefore proposes a method based on embedding watermark patterns in two of the three color planes constituting a color picture so that these two planes have a specific correlation less subject to random geometric distortion. Experimental evaluations using StirMark confirmed that information of over 100 bits embedded in 256 × 256-pixel pictures can be correctly detected without using searches or special patterns.
AB - Random geometric distortion is one of the most difficult kinds of image processing to survive and has been a noted problem in watermarking research. Previous methods for dealing with random geometric distortion, however, are accompanied by large computational overhead or by operational inconvenience. This paper therefore proposes a method based on embedding watermark patterns in two of the three color planes constituting a color picture so that these two planes have a specific correlation less subject to random geometric distortion. Experimental evaluations using StirMark confirmed that information of over 100 bits embedded in 256 × 256-pixel pictures can be correctly detected without using searches or special patterns.
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U2 - 10.1109/ICME.2005.1521398
DO - 10.1109/ICME.2005.1521398
M3 - Conference contribution
AN - SCOPUS:33750570421
SN - 0780393325
SN - 9780780393325
T3 - IEEE International Conference on Multimedia and Expo, ICME 2005
SP - 213
EP - 216
BT - IEEE International Conference on Multimedia and Expo, ICME 2005
T2 - IEEE International Conference on Multimedia and Expo, ICME 2005
Y2 - 6 July 2005 through 8 July 2005
ER -