Data processing software suite SITENNO for coherent X-ray diffraction imaging using the X-ray free-electron laser SACLA

Yuki Sekiguchi, Tomotaka Oroguchi, Yuki Takayama, Masayoshi Nakasako

研究成果: Article査読

26 被引用数 (Scopus)

抄録

Coherent X-ray diffraction imaging is a promising technique for visualizing the structures of non-crystalline particles with dimensions of micrometers to sub-micrometers. Recently, X-ray free-electron laser sources have enabled efficient experiments in the 'diffraction before destruction' scheme. Diffraction experiments have been conducted at SPring-8 Angstrom Compact free-electron LAser (SACLA) using the custom-made diffraction apparatus KOTOBUKI-1 and two multiport CCD detectors. In the experiments, ten thousands of single-shot diffraction patterns can be collected within several hours. Then, diffraction patterns with significant levels of intensity suitable for structural analysis must be found, direct-beam positions in diffraction patterns determined, diffraction patterns from the two CCD detectors merged, and phase-retrieval calculations for structural analyses performed. A software suite named SITENNO has been developed to semi-automatically apply the four-step processing to a huge number of diffraction data. Here, details of the algorithm used in the suite are described and the performance for approximately 9000 diffraction patterns collected from cuboid-shaped copper oxide particles reported. Using the SITENNO suite, it is possible to conduct experiments with data processing immediately after the data collection, and to characterize the size distribution and internal structures of the non-crystalline particles.

本文言語English
ページ(範囲)600-612
ページ数13
ジャーナルJournal of Synchrotron Radiation
21
3
DOI
出版ステータスPublished - 2014 5

ASJC Scopus subject areas

  • 放射線
  • 核物理学および高エネルギー物理学
  • 器械工学

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