Development of 16-DOF telesurgical forceps master/slave robot with haptics

Wataru Motooka, Takahiro Nozaki, Takahiro Mizoguchi, Keisuke Sugawara, Fumiya Mitome, Keishi Okuda, Midori Miyagaki, Daisuke Yashiro, Takahiro Yakoh, Kouhei Ohnishi, Yasuhide Morikawa, Naoki Shimojima

研究成果: Conference contribution

9 引用 (Scopus)

抜粋

Minimally invasive surgery (MIS) has attracted attention recently. MIS such as endoscopic surgery considers a patient's quality of life. In endoscopic surgeries, bilateral control systems are strongly required to apply. It is necessary to develop the multi Degrees Of Freedom (DOF) robot to achieve various operation procedures including endoscopic surgery. In this paper, 16-DOF haptic telesurgery master/slave robot is developed. This master/slave robot has two arms, and each arm has 8-DOF. The bilateral control using 4ch controller is implemented in the master/slave robot. Experiments of peeling motion and suturing motion are performed by a surgeon to evaluate the development robot.

元の言語English
ホスト出版物のタイトルProceedings - IECON 2010, 36th Annual Conference of the IEEE Industrial Electronics Society
ページ2081-2086
ページ数6
DOI
出版物ステータスPublished - 2010 12 1
イベント36th Annual Conference of the IEEE Industrial Electronics Society, IECON 2010 - Glendale, AZ, United States
継続期間: 2010 11 72010 11 10

出版物シリーズ

名前IECON Proceedings (Industrial Electronics Conference)

Other

Other36th Annual Conference of the IEEE Industrial Electronics Society, IECON 2010
United States
Glendale, AZ
期間10/11/710/11/10

    フィンガープリント

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

これを引用

Motooka, W., Nozaki, T., Mizoguchi, T., Sugawara, K., Mitome, F., Okuda, K., Miyagaki, M., Yashiro, D., Yakoh, T., Ohnishi, K., Morikawa, Y., & Shimojima, N. (2010). Development of 16-DOF telesurgical forceps master/slave robot with haptics. : Proceedings - IECON 2010, 36th Annual Conference of the IEEE Industrial Electronics Society (pp. 2081-2086). [5675353] (IECON Proceedings (Industrial Electronics Conference)). https://doi.org/10.1109/IECON.2010.5675353