Development of nanometer scale temperature measurement method with polarized near-field light

Shunsuke Hosaka, Jumpei Nitta, Yoshihiro Taguchi, Yuji Nagasaka, Toshiharu Saiki

研究成果: Conference contribution

抄録

We report on the development of a temperature measurement method at the nanoscale using polarized near-field light. In this method, temperature measurement is accomplished by detecting the near-field polarization change in illumination-collection mode operation.

本文言語English
ホスト出版物のタイトルProceedings - OMN2011
ホスト出版物のサブタイトル16th International Conference on Optical MEMS and Nanophotonics
ページ59-60
ページ数2
DOI
出版ステータスPublished - 2011 12 12
イベント16th International Conference on Optical MEMS and Nanophotonics, OMN2011 - Istanbul, Turkey
継続期間: 2011 8 82011 8 11

出版物シリーズ

名前International Conference on Optical MEMS and Nanophotonics
ISSN(印刷版)2160-5033
ISSN(電子版)2160-5041

Other

Other16th International Conference on Optical MEMS and Nanophotonics, OMN2011
CountryTurkey
CityIstanbul
Period11/8/811/8/11

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

フィンガープリント 「Development of nanometer scale temperature measurement method with polarized near-field light」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル