Development of nanoscale thermometry by fluorescence lifetime measurement in near-field using time correlated single photon counting

Daichi Seto, Yoshihiro Taguchi, Toshiharu Saiki, Yuji Nazasaka

研究成果: Conference contribution

抄録

A novel noncontact and nanoscale temperature measurement method using fluorescence in near-field, namely Fluor-NOTN (Fluorescence Near-field Optics Thermal Nanoscopy) has been developed. Fluor-NOTN enables to detect the temperature dependence of fluorescence lifetime of CdSe quantum dots (Qdot) at nanoscale spatial resolution. In our case, however, the spatial resolution is limited by the sensitivity of the optical system. This paper reports the feasibility study of a proposed TCSPC (Time Correlated Single Photon Counting) to enhance the temperature measurement sensitivity of Fluor-NOTN. The experimental result indicated that Fluor-NOTN using TCSPC can measure the near-field fluorescence lifetime with 60 nm spatial resolution.

本文言語English
ホスト出版物のタイトル2014 International Conference on Optical MEMS and Nanophotonics, OMN 2014 - Proceedings
出版社IEEE Computer Society
ページ77-78
ページ数2
ISBN(電子版)9780992841423
DOI
出版ステータスPublished - 2014 10月 14
イベント2014 International Conference on Optical MEMS and Nanophotonics, OMN 2014 - Glasgow, United Kingdom
継続期間: 2014 8月 172014 8月 21

出版物シリーズ

名前International Conference on Optical MEMS and Nanophotonics
ISSN(印刷版)2160-5033
ISSN(電子版)2160-5041

Other

Other2014 International Conference on Optical MEMS and Nanophotonics, OMN 2014
国/地域United Kingdom
CityGlasgow
Period14/8/1714/8/21

ASJC Scopus subject areas

  • ハードウェアとアーキテクチャ
  • 電子工学および電気工学
  • 電子材料、光学材料、および磁性材料

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