Dielectric relaxation in amorphous and crystalline Sb2Te3 thin films

A. A. Kononov, R. A. Castro, Y. Saito, P. Fons, G. A. Bordovsky, N. I. Anisimova, A. V. Kolobov

研究成果: Article査読

抄録

Sb2Te3 is an endpoint of the GeTe-Sb2Te3 quasi-binary tie-line that represents phase-change alloys widely used in optical and non-volatile phase-change memory devices. In the crystalline form it is also a prototypical topological insulator with a layered structure where covalently bonded quintuple layers are held together by weak van der Waals forces. One of the ways to fabricate a crystalline phase is solid-state crystallization of an amorphous film, whereby the three-dimensional (3D) structure relaxes to the two-dimensional (2D) crystalline phase. The mechanism of the 3D-2D transformation remains unclear. In this work, we performed a study of relaxation processes in thin Sb2Te3 films in both amorphous and crystalline phases. We found that both phases possess two kinds of relaxators (type I and type II), where the type I fragments are identical in the two phases, while the relaxation of type II fragments are shifted to lower temperature in the amorphous phases. The activation energies of the associated relaxation processes and the values of the Havriliak–Negami parameters were determined. The differences between the relaxation processes in the two phases are discussed. The obtained result will contribute to better understanding of the 3D-2D transformation during the crystallization of van der Waals solids.

本文言語English
ページ(範囲)14072-14078
ページ数7
ジャーナルJournal of Materials Science: Materials in Electronics
32
10
DOI
出版ステータスPublished - 2021 5

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 原子分子物理学および光学
  • 凝縮系物理学
  • 電子工学および電気工学

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