Domain switching and crack tip opening stress variation in ferroelectric ceramics

Sang Joo Kim, Yun Jae Kim

研究成果: Article査読

1 被引用数 (Scopus)

抄録

Evolution of switching zone near a crack tip in ferroelectric ceramics is calculated using the constitutive equations proposed in [1], with an assumption that switching-induced internal fields are minimized by fine domain microstructures and moving charges. A two-dimensional ferroelectric ceramic specimen that has an edge crack and that is poled perpendicular to the crack plane are subjected to external stress and electric fields. Diverse crack tip microstructures are obtained depending on both the history and the ratio of electric and stress loads. It is shown that opposite crack tip opening stresses under the same electric fields are due to opposite distributions of piezoelectric coefficients in the specimens with different crack tip microstructures.

本文言語English
ページ(範囲)2557-2564
ページ数8
ジャーナルKey Engineering Materials
297-300 IV
DOI
出版ステータスPublished - 2005

ASJC Scopus subject areas

  • 材料科学(全般)
  • 材料力学
  • 機械工学

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