Dual-probe scanning near-field optical microscopy (DSNOM) utilizing ultrafast plasmon nano-focusing

Yasuhiro Kojima, Yuta Masaki, Fumihiko Kannari

研究成果: Conference contribution

抄録

Dual-probe scanning near-field optical microscopy combining spectral interferometry (SI-DSNOM) which utilizes ultrafast surface-plasmon polariton nanofocusing as excitation light is constructed and experimentally demonstrated. We achieve spatiotemporal resolution of 100 nm and 10 fs.

本文言語English
ホスト出版物のタイトル2016 Conference on Lasers and Electro-Optics, CLEO 2016
出版社Institute of Electrical and Electronics Engineers Inc.
ISBN(電子版)9781943580118
DOI
出版ステータスPublished - 2016 12 16
イベント2016 Conference on Lasers and Electro-Optics, CLEO 2016 - San Jose, United States
継続期間: 2016 6 52016 6 10

出版物シリーズ

名前2016 Conference on Lasers and Electro-Optics, CLEO 2016

Other

Other2016 Conference on Lasers and Electro-Optics, CLEO 2016
CountryUnited States
CitySan Jose
Period16/6/516/6/10

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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