Effective-mass anomalies of strained silicon thin films: Surface and confinement effects

Jun Yamauchi, Shunichi Matsuno

研究成果: Article査読

4 被引用数 (Scopus)

抄録

Using a first-principles calculation, we systematically investigated the effective-mass anomalies in 〈111〉- and 〈110〉-confined Si thin films. The surface terminators, which correspond to the interface between the Si channel and the insulator in real devices, do not have a significant effect on the effective mass anomalies. The effective-mass behaviors as a function of the substrate thickness and the strain is qualitatively well explained by the extended effective-mass approximation using the bulk effective-mass along the confinement direction.

本文言語English
ページ(範囲)3273-3276
ページ数4
ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
46
5 B
DOI
出版ステータスPublished - 2007 5 17

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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