Electric field broadening of gallium acceptor states in compensated Ge:Ga,As

K. M. Itoh, W. Walukiewicz, J. W. Beeman, E. E. Haller, Hyunjung Kim, A. J. Mayur, M. D. Sciacca, A. K. Ramdas, R. Buczko, J. W. Farmer, V. I. Ozhogin

研究成果: Conference article

1 引用 (Scopus)

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We report on low-temperature infrared absorption spectroscopy studies of p-type Ge:Ga,As samples with varying doping compensation ratios. Previous difficulties in fabricating appropriate samples are overcome by applying the neutron transmutation doping technique to high purity germanium of isotopically controlled composition with 70Ge and 74Ge. With this technique, we have produced a series of crystals with compensation ratios between 0.082 and 0.87 while maintaining the net-acceptor concentration [Ga]-[As] constant at 5×1014cm-3. The observed Ga impurity absorption peaks broaden linearly with the ionized impurity concentration due to the quadrupole interactions between Ga bound holes and the electric field gradient. Experimental linewidths are quantitatively compared to existing theories of electric field broadening for donor 1s-2p transitions. We find excellent agreement with the theory which is based on the correlated distribution of ionized impurity centers.

元の言語English
ページ(範囲)127-132
ページ数6
ジャーナルMaterials Science Forum
196-201
発行部数pt 1
出版物ステータスPublished - 1995 12 1
イベントProceedings of the 1995 18th International Conference on Defects in Semiconductors, ICDS-18. Part 1 (of 4) - Sendai, Jpn
継続期間: 1995 7 231995 7 28

    フィンガープリント

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

これを引用

Itoh, K. M., Walukiewicz, W., Beeman, J. W., Haller, E. E., Kim, H., Mayur, A. J., Sciacca, M. D., Ramdas, A. K., Buczko, R., Farmer, J. W., & Ozhogin, V. I. (1995). Electric field broadening of gallium acceptor states in compensated Ge:Ga,As. Materials Science Forum, 196-201(pt 1), 127-132.