Electron beam probe quantization of compound composition: Surface phases and surface roughness

A. Yamada, P. Fons, K. Matsubara, K. Iwata, K. Sakurai, S. Niki

研究成果: Conference article査読

9 被引用数 (Scopus)

抄録

In electron probe beam micro-analysis (EPMA), the electron accelerating voltage decides the penetration depth of the probe beam therefore the voltage dependence of the characteristic X-ray emission intensities reflects the composition depth distribution. This effect can be utilized to determine an accurate composition value for the matrix and to identify other phases. As the measured emission intensity is a convolution of the entire probed depth, a parameter fitting procedures using a computer was developed to deconvolute measured spectra of accelerating voltage dependent data. Using this method, a surface phase segregated on CuGaSe2 epi-layers grown by molecular-beam epitaxy under Cu-excess conditions was detected and found to be Cu3Se2. Oxidation of CuInSe2 or CuGaSe2 film surfaces was also detected by EPMA. The thickness of the natural oxide layers evaluated by this technique was several nanometers. The weakest point in EPMA analysis is its sensitivity to specimen surface roughness. A theoretical estimation of surface roughness effects matched actual data well. This result suggests possible corrections for measured values on rough surfaces.

本文言語English
ページ(範囲)277-283
ページ数7
ジャーナルThin Solid Films
431-432
DOI
出版ステータスPublished - 2003 5月 1
外部発表はい
イベントProceedings of Symposium B - Strasbourg, France
継続期間: 2002 6月 182002 6月 21

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 表面および界面
  • 表面、皮膜および薄膜
  • 金属および合金
  • 材料化学

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