Element-selective vertical height determination for an organic monolayer by a scanned-energy photoelectron-yield soft x-ray standing wave technique

H. Kondoh, R. Yokota, K. Amemiya, T. Shimada, I. Nakai, M. Nagasaka, T. Ohta, T. Nakamura, H. Takenaka

研究成果: Article査読

1 被引用数 (Scopus)

抄録

A photoelectron-yield soft x-ray standing wave (SW) technique with the scanned-energy mode has been applied to the vertical height determination of the atoms of specific elements involved in an organic monolayer prepared by the Langmuir-Blodgett method on a WC superlattice substrate (d=30.9 Å) that serves as a SW generator. The vertical positions of two different-element atoms were determined from the SW profiles. This kind of information is complementary to the molecular-orientation estimation by the polarized x-ray absorption spectroscopy and the combination of these techniques will be a powerful tool to understand the structures of organic monolayers.

本文言語English
論文番号031911
ジャーナルApplied Physics Letters
87
3
DOI
出版ステータスPublished - 2005 7 18
外部発表はい

ASJC Scopus subject areas

  • 物理学および天文学(その他)

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