Energy dispersive near edge X-ray absorption fine structure in the soft X-ray region: A new technique to investigate surface reactions

K. Amemiya, H. Kondoh, A. Nambu, M. Iwasaki, I. Nakai, T. Yokoyama, T. Ohta

研究成果: Article査読

14 被引用数 (Scopus)

抄録

A novel technique, energy dispersive near edge X-ray absorption tine structure (NEXAFS) spectroscopy, has been successfully developed by using a position sensitive electron analyzer and a new soft X-ray beamline constructed at the bending magnet in the Photon Factory. It was revealed that the NEXAFS spectra can be obtained even for submonolayer adsorbates with an accumulation period of ∼ 30 s. As the first application of the new technique, coverage dependence of C-K-edge NEXAFS spectra were recorded in situ for thiophene adsorption on Au(111).

本文言語English
ページ(範囲)L718-L720
ジャーナルJapanese Journal of Applied Physics, Part 2: Letters
40
7 B
DOI
出版ステータスPublished - 2001 7 15
外部発表はい

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(その他)
  • 物理学および天文学(全般)

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