Enhanced tunnel conductance due to QCA cotunneling processes observed for silicon serial triple quantum dots

Gento Yamahata, Ken Uchida, Shunri Oda, Yoshishige Tsuchiya, Hiroshi Mizuta

研究成果: Conference contribution

1 引用 (Scopus)

抜粋

We study single-electron tunneling characteristics of silicon serial triple quantum dots which consist of lithographically-defined double quantum dots interconnected with a naturally-formed and smaller quantum dot. By controlling the single-electron tunneling through the triple quantum dots electrostatically using multiple side gates, the charge stability diagrams are characterized experimentally and theoretically. Several charge quadruple points are observed where sequential tunneling throughout the triple quantum dots is enabled. In addition, enhancement of tunnel conductance is observed along the two-hold degeneracy boundaries across which two electrons exhibit quantum cellular automata (QCA) cotunneling processes.

元の言語English
ホスト出版物のタイトルESSDERC 2008 - Proceedings of the 38th European Solid-State Device Research Conference
出版者IEEE Computer Society
ページ314-317
ページ数4
ISBN(印刷物)9781424423644
DOI
出版物ステータスPublished - 2008 1 1
イベントESSDERC 2008 - 38th European Solid-State Device Research Conference - Edinburgh, Scotland, United Kingdom
継続期間: 2008 9 152008 9 19

出版物シリーズ

名前ESSDERC 2008 - Proceedings of the 38th European Solid-State Device Research Conference

Other

OtherESSDERC 2008 - 38th European Solid-State Device Research Conference
United Kingdom
Edinburgh, Scotland
期間08/9/1508/9/19

    フィンガープリント

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

これを引用

Yamahata, G., Uchida, K., Oda, S., Tsuchiya, Y., & Mizuta, H. (2008). Enhanced tunnel conductance due to QCA cotunneling processes observed for silicon serial triple quantum dots. : ESSDERC 2008 - Proceedings of the 38th European Solid-State Device Research Conference (pp. 314-317). [4681761] (ESSDERC 2008 - Proceedings of the 38th European Solid-State Device Research Conference). IEEE Computer Society. https://doi.org/10.1109/ESSDERC.2008.4681761