Experimental prediction of wavelength dependence of optical path length for optical intrinsic signal analysis

K. Sakaguchi, Furukawa, T. Katsura, A. Maki, K. Yamazaki, H. Kawaguchi, E. Okada

研究成果: Conference contribution

抜粋

The wavelength dependence of the optical path length is experimentally estimated from the multi-spectral reflectance. The proposed method is applied to the path length correction in optical intrinsic signal analysis of the exposed cortex.

元の言語English
ホスト出版物のタイトル19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
出版者Institute of Electrical and Electronics Engineers Inc.
ページ601-602
ページ数2
ISBN(印刷物)0780395557, 9780780395558
DOI
出版物ステータスPublished - 2006 1 1
イベント19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS - Montreal, QC, Canada
継続期間: 2006 10 292006 11 2

出版物シリーズ

名前Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
ISSN(印刷物)1092-8081

Other

Other19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
Canada
Montreal, QC
期間06/10/2906/11/2

    フィンガープリント

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

これを引用

Sakaguchi, K., Furukawa, Katsura, T., Maki, A., Yamazaki, K., Kawaguchi, H., & Okada, E. (2006). Experimental prediction of wavelength dependence of optical path length for optical intrinsic signal analysis. : 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS (pp. 601-602). [4054327] (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/LEOS.2006.278820