Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis

Suguru Kanoga, Yasue Mitsukura

研究成果: Conference contribution

11 被引用数 (Scopus)

抄録

To study an eye blink artifact rejection scheme from single-channel electroencephalographic (EEG) signals has been now a major challenge in the field of EEG signal processing. High removal performance is still needed to more strictly investigate pattern of EEG features. This paper proposes a new eye blink artifact rejection scheme from single-channel EEG signals by combining complete ensemble empirical mode decomposition (CEEMD) and independent component analysis (ICA). We compare the separation performance of our proposed scheme with existing schemes (wavelet-ICA, EMD-ICA, and EEMD-ICA) though real-life data by using signal-to-noise ratio. As a result, CEEMD-ICA showed high performance (11.86 dB) than all other schemes (10.78, 10.59, and 11.30 dB) in the ability of eye blink artifact removal.

本文言語English
ホスト出版物のタイトルProceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS
出版社Institute of Electrical and Electronics Engineers Inc.
ページ121-124
ページ数4
2015-November
ISBN(印刷版)9781424492718
DOI
出版ステータスPublished - 2015 11月 4
イベント37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015 - Milan, Italy
継続期間: 2015 8月 252015 8月 29

Other

Other37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015
国/地域Italy
CityMilan
Period15/8/2515/8/29

ASJC Scopus subject areas

  • コンピュータ ビジョンおよびパターン認識
  • 信号処理
  • 生体医工学
  • 健康情報学

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