We propose a method to fabricate a novel triple tapered probe for highly sensitive and highly resolved near-field optical microscopy in a near ultraviolet region. The method is based on selective etching of a multistep index fiber. The obtained fiber probe has a triple tapered structure with three taper angles of 60°, 120°, and 60°. With near-field optical microscopy employing the probe, we succeeded in obtaining a photoluminescence image of polysilanes excited by an ultraviolet laser with a wavelength of 351 nm.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Physical and Theoretical Chemistry
- Electrical and Electronic Engineering