Free induction decay and quantum beat of excitons in ZnSe

T. Saiki, K. Takeuchi, K. Ema, M. Kuwata-Gonokami, K. Ohkawa, T. Mitsuyu

研究成果: Article

8 引用 (Scopus)

抜粋

We study coherent transient phenomena of excitons using femtosecond time-resolved four-wave-mixing (TR- FWM) in two types of high quality thin films of ZnSe; one is a homo-epitaxial film (1.2 μm thickness) and the other is a very thin (50nm) hetero-epitaxial film on GaAs substrate. Free induction decay (FID) behavior of the third-order polarization is clearly observed. We obtained the same values of exciton dephasing time from the temporal measurements, the decay time of FID, and the frequency domain measurements, analyses of reflection spectra. This implies that the excitons in ZnSe films are homogeneous. In the thin film sample, we observe a beat signal in time-integrated and time-resolved FWM. Based on the perturbational calculation, we conclude that the beat originates from the quantum interference of heavy- and light-hole excitons.

元の言語English
ページ(範囲)805-808
ページ数4
ジャーナルJournal of Crystal Growth
138
発行部数1-4
DOI
出版物ステータスPublished - 1994 4 2
外部発表Yes

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ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry

これを引用

Saiki, T., Takeuchi, K., Ema, K., Kuwata-Gonokami, M., Ohkawa, K., & Mitsuyu, T. (1994). Free induction decay and quantum beat of excitons in ZnSe. Journal of Crystal Growth, 138(1-4), 805-808. https://doi.org/10.1016/0022-0248(94)90911-3