High resolution electron microscopy observation of TiC coated cemented carbide

Tetsuya Suzuki, Masaru Yagi, Kunio Shibuki, Toshiyuki Suzuki, Yuichi Ikuhara

研究成果: Article査読

3 被引用数 (Scopus)

抄録

Cemented carbide (WC-6%Co) inserts were coated with 3-4 μm TiC by chemical vapor deposition at 1200 °C. High resolution electron microscopic observation showed the presence of Co6W6C (n1-phase) around the interface WC-Co, on top of which a TiC film 50-100 nm in size was observed. There was no particular crystallographic orientation relationship between the n1-phase and TiC films. The presence of W atoms in the films was confirmed using EDX by focusing an electron beam of size approximately 5 nm. In addition, the Σ = 2 boundary, which was attributed to the identical c/a ratio of WC, was observed between WC-WC grains.

本文言語English
ページ(範囲)268-275
ページ数8
ジャーナルSurface and Coatings Technology
79
1-3
DOI
出版ステータスPublished - 1996 2
外部発表はい

ASJC Scopus subject areas

  • 化学 (全般)
  • 凝縮系物理学
  • 表面および界面
  • 表面、皮膜および薄膜
  • 材料化学

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