TY - JOUR
T1 - High resolution electron microscopy observation of TiC coated cemented carbide
AU - Suzuki, Tetsuya
AU - Yagi, Masaru
AU - Shibuki, Kunio
AU - Suzuki, Toshiyuki
AU - Ikuhara, Yuichi
PY - 1996/2
Y1 - 1996/2
N2 - Cemented carbide (WC-6%Co) inserts were coated with 3-4 μm TiC by chemical vapor deposition at 1200 °C. High resolution electron microscopic observation showed the presence of Co6W6C (n1-phase) around the interface WC-Co, on top of which a TiC film 50-100 nm in size was observed. There was no particular crystallographic orientation relationship between the n1-phase and TiC films. The presence of W atoms in the films was confirmed using EDX by focusing an electron beam of size approximately 5 nm. In addition, the Σ = 2 boundary, which was attributed to the identical c/a ratio of WC, was observed between WC-WC grains.
AB - Cemented carbide (WC-6%Co) inserts were coated with 3-4 μm TiC by chemical vapor deposition at 1200 °C. High resolution electron microscopic observation showed the presence of Co6W6C (n1-phase) around the interface WC-Co, on top of which a TiC film 50-100 nm in size was observed. There was no particular crystallographic orientation relationship between the n1-phase and TiC films. The presence of W atoms in the films was confirmed using EDX by focusing an electron beam of size approximately 5 nm. In addition, the Σ = 2 boundary, which was attributed to the identical c/a ratio of WC, was observed between WC-WC grains.
KW - Cemented carbide
KW - High resolution electron microscopy
KW - Interface
KW - TiC film
KW - η-phase
UR - http://www.scopus.com/inward/record.url?scp=0030083671&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0030083671&partnerID=8YFLogxK
U2 - 10.1016/0257-8972(95)02464-6
DO - 10.1016/0257-8972(95)02464-6
M3 - Article
AN - SCOPUS:0030083671
SN - 0257-8972
VL - 79
SP - 268
EP - 275
JO - Surface and Coatings Technology
JF - Surface and Coatings Technology
IS - 1-3
ER -