Image quality improvement for low dose exposure in the sparse X-ray CT scanner

Takashi Kobayashi, Toshiyuki Tanaka

研究成果: Conference contribution

1 引用 (Scopus)

抄録

In X-ray CT, medical X-ray exposure is the key issue for patients. Recently, low dose exposure is demanded in the industrial X-ray CT. But the dose of X-ray and the image quality are directly correlated. Therefore, research objective is to get high quality images trying to minimize X-ray exposure. Specifically, we reduce the number of X-ray views. We supplied data by using linear interpolation. As a result, we were able to eliminate conspicuous line noise to occur by having reduced the number of views. But different noises extending to horizontal rotatory direction occurred in the method.

元の言語English
ホスト出版物のタイトル2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015
出版者Institute of Electrical and Electronics Engineers Inc.
ページ41-44
ページ数4
ISBN(印刷物)9784907764487
DOI
出版物ステータスPublished - 2015 9 30
イベント54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015 - Hangzhou, China
継続期間: 2015 7 282015 7 30

Other

Other54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015
China
Hangzhou
期間15/7/2815/7/30

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Image quality
Dosimetry
X rays
Interpolation

ASJC Scopus subject areas

  • Control and Systems Engineering

これを引用

Kobayashi, T., & Tanaka, T. (2015). Image quality improvement for low dose exposure in the sparse X-ray CT scanner. : 2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015 (pp. 41-44). [7285467] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SICE.2015.7285467

Image quality improvement for low dose exposure in the sparse X-ray CT scanner. / Kobayashi, Takashi; Tanaka, Toshiyuki.

2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 41-44 7285467.

研究成果: Conference contribution

Kobayashi, T & Tanaka, T 2015, Image quality improvement for low dose exposure in the sparse X-ray CT scanner. : 2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015., 7285467, Institute of Electrical and Electronics Engineers Inc., pp. 41-44, 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015, Hangzhou, China, 15/7/28. https://doi.org/10.1109/SICE.2015.7285467
Kobayashi T, Tanaka T. Image quality improvement for low dose exposure in the sparse X-ray CT scanner. : 2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015. Institute of Electrical and Electronics Engineers Inc. 2015. p. 41-44. 7285467 https://doi.org/10.1109/SICE.2015.7285467
Kobayashi, Takashi ; Tanaka, Toshiyuki. / Image quality improvement for low dose exposure in the sparse X-ray CT scanner. 2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 41-44
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