Imaging and Characterizing Long-Range Surface Plasmon Polaritons Propagating in a Submillimeter Scale by Two-Color Two-Photon Photoelectron Emission Microscopy

Long-range surface plasmon polaritons (SPPs), which propagate along metal/dielectric interfaces to submillimeter distances in the range of near-infrared (NIR) excitation wavelength, were examined by two-color two-photon photoelectron emission microscopy (2P-PEEM). Interferences between incident NIR photons and SPPs excited by the NIR photons at surface defects were imaged by detecting photoelectrons emitted from a gold surface, assisted by simultaneously irradiated ultraviolet photons which are to overcome the workfunction of the surface. The wavelength of the interference beat depends sensitively on the NIR wavelength. By analyzing the interference beat, the dispersion curve as well as phase and group velocities of SPP's were experimentally obtained. The results closely match the theoretical one based on the Drude free electron model, indicating that two-color 2P-PEEM is applicable not only to the visualization of NIR-excited SPPs but also to the quantitative analysis of its physical properties. This method will be widely used to observe SPPs for various artificial plasmonic devices.