In situ AP-XPS analysis of a Pt thin-film sensor for highly sensitive H2detection

Ryo Toyoshima, Takahisa Tanaka, Taro Kato, Ken Uchida, Hiroshi Kondoh

研究成果: Article査読

抄録

In situ ambient-pressure X-ray photoelectron spectroscopy (AP-XPS) combined with resistivity measurement was performed for a Pt thin-film H2 gas sensor. We experimentally demonstrate that the chemical state of the Pt surface changes under working conditions, and it directly links to the sensing performance. Moreover, the operating principle is discussed at the atomic scale. This journal is

本文言語English
ページ(範囲)10147-10150
ページ数4
ジャーナルChemical Communications
56
70
DOI
出版ステータスPublished - 2020 9 11

ASJC Scopus subject areas

  • Catalysis
  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Chemistry(all)
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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