TY - GEN
T1 - Invisible calibration pattern based on human visual perception
AU - Takimoto, Hironori
AU - Yoshimori, Seiki
AU - Mitsukura, Yasue
AU - Fukumi, Minora
PY - 2010/6/25
Y1 - 2010/6/25
N2 - In the print-type steganographic system and water-mark, a calibration pattern is arranged around contents where invisible data is embedded, as plural feature points between an original image and the scanned image for normalization of the scanned image. However, it is clear that conventional methods interfere with page layout and artwork of contents. In addition, visible calibration patterns are not suitable for security service. In this paper, we propose an arrangement and detection method of an invisible calibration pattern based on human visual perception. We embed the calibration pattern in an original image by adding high frequency component to blue intensity in a limited region. Moreover, the proposed calibration pattern protects page layout and artwork.
AB - In the print-type steganographic system and water-mark, a calibration pattern is arranged around contents where invisible data is embedded, as plural feature points between an original image and the scanned image for normalization of the scanned image. However, it is clear that conventional methods interfere with page layout and artwork of contents. In addition, visible calibration patterns are not suitable for security service. In this paper, we propose an arrangement and detection method of an invisible calibration pattern based on human visual perception. We embed the calibration pattern in an original image by adding high frequency component to blue intensity in a limited region. Moreover, the proposed calibration pattern protects page layout and artwork.
UR - http://www.scopus.com/inward/record.url?scp=77953801269&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77953801269&partnerID=8YFLogxK
U2 - 10.1109/AMC.2010.5464008
DO - 10.1109/AMC.2010.5464008
M3 - Conference contribution
AN - SCOPUS:77953801269
SN - 9781424466696
T3 - International Workshop on Advanced Motion Control, AMC
SP - 159
EP - 163
BT - AMC2010 - The 11th IEEE International Workshop on Advanced Motion Control, Proceedings
T2 - 2010 11th IEEE International Workshop on Advanced Motion Control, AMC2010
Y2 - 21 March 2010 through 24 March 2010
ER -