Low-frequency dielectric relaxation in amorphous MoTe2layers obtained by RF magnetron sputtering

Rene Castro, Sergej Khachaturov, Aleksei Kononov, Yuta Saito, Paul Fons, Nadezhda Anisimova, Alexander Kolobov

研究成果: Conference contribution

抄録

The results of a study on dielectric relaxation in thin layers of amorphous MoTe2 using dielectric spectroscopy are presented. Dipole-relaxation polarization has been observed. The activation energy of the relaxation process was calculated to be Ea = (0.44±0.02) eV. The dispersion of the dielectric constant and the presence of a maximum of dielectric losses in the studied MoTe2 films may be due to the disordered structure of the amorphous material and the presence of chalcogen vacancies.

本文言語English
ホスト出版物のタイトルProceedings of the XV International Conference "Physics of Dielectrics"
編集者Yuriy Gorokhovatsky, Dmitry Temnov, Viktoria Kapralova, Nicolay Sudar, Elena Velichko
出版社American Institute of Physics Inc.
ISBN(電子版)9780735440449
DOI
出版ステータスPublished - 2020 12 1
イベント15th International Conference on Physics of Dielectrics, Dielectrics 2020 - St. Petersburg, Russian Federation
継続期間: 2020 10 52020 10 8

出版物シリーズ

名前AIP Conference Proceedings
2308
ISSN(印刷版)0094-243X
ISSN(電子版)1551-7616

Conference

Conference15th International Conference on Physics of Dielectrics, Dielectrics 2020
CountryRussian Federation
CitySt. Petersburg
Period20/10/520/10/8

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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