Magneto-photoluminescence study of quantum dots formed on tetrahedral-shaped recesses

Y. Sakuma, Y. Awano, T. Futatsugi, N. Yokoyama, K. Uchida, N. Miura

研究成果: Article査読

6 被引用数 (Scopus)

抄録

Novel InGaAs quantum dot (QD) structures were fabricated in tetrahedral-shaped recesses (TSRs) formed on a GaAs (111)B substrate using low-pressure metalorganic chemical vapor deposition (MOCVD). The dots were formed in a self-forming manner at the bottom of TSRs due to the compositional nonuniformity of InGaAs grown inside the TSRs. To confirm directly zero-dimensional carrier confinement, magneto-photoluminescence (PL) measurements were performed for several InGaAs TSR-QDs under pulsed high magnetic fields in both Faraday and Voigt configurations. The diamagnetic shifts of QDs were clearly suppressed compared to the corresponding InGaAs quantum wells formed at the TSR sidewalk. The typical deduced Bohr radius from the hydrogen-like exciton model clearly proves a zero-dimensional carrier confinement into the TSR-QD. Moreover, the changes in the strength and anisotropy of the QDs' confinement potential obtained from the magneto-PL results were consistent with the intentional change in the design of the TSR-QDs. Through these studies, we clarified that it is possible to control the carrier confinement potential of TSR-QDs by independently changing the In-content and the thickness of InGaAs during MOCVD growth.

本文言語English
ページ(範囲)1341-1347
ページ数7
ジャーナルSolid-State Electronics
42
7-8
DOI
出版ステータスPublished - 1998
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • 電子工学および電気工学
  • 材料化学

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