Measurement of elliptically-polarized E-field waveforms in mid infrared range by electro-optic sampling

Kenichi Oguchi, Takayuki Kurihara, Marco Fischer, Shinichi Watanabe, Daniele Brida

研究成果: Conference contribution

抄録

Electro-optic sampling (EOS) is a technique widely used to measure electric field waveform in ultra-broadband frequency range from terahertz (THz), mid- (MIR) [1], and near infrared (NIR) [2]. Since EOS signal depends on the relative orientations between probe, THz and crystal axis, the modulation of EOS signal upon crystal rotation provides polarization information of the infrared pulses [3, 4]. This so-called polarization-sensitive (PS-) EOS has an advantage that no additional polarization optics such as wire-grid polarizer is needed to measure polarization. In this talk we extend PS-EOS for the first time to the MIR region, wherein fruitful application possibilities such as vibrational circular dichroism [5] are expected.

本文言語English
ホスト出版物のタイトルJSAP-OSA Joint Symposia, JSAP 2018
出版社OSA - The Optical Society
ISBN(印刷版)9784863486942
出版ステータスPublished - 2018
イベントJSAP-OSA Joint Symposia, JSAP 2018 - Nagoya, Japan
継続期間: 2018 9 182018 9 21

出版物シリーズ

名前Optics InfoBase Conference Papers
Part F125-JSAP 2018

Conference

ConferenceJSAP-OSA Joint Symposia, JSAP 2018
国/地域Japan
CityNagoya
Period18/9/1818/9/21

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 材料力学

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