Measurement of the ferromagnetic resonance of a single micron dot by using a vector network analyzer

Kazuto Yamanoi, Takashi Manago, Satoshi Yakata, Takashi Kimura

研究成果: Article査読

抄録

The ferromagnetic resonance of a single micron-scale dot of permalloy was measured by using a vector network analyzer. The resonant frequency shifted to higher frequency with increasing aspect ratio of the sample. This tendency was remarkable for narrower width samples, especially the 1-μm-width dots. This means that the demagnetization effect of thin films for the ferromagnetic resonance becomes large when the sample width is less than 1 μm. The resonant frequency can be largely controlled by changing the sample width for a thin film with a width of less than 1 μm, which is a favorable characteristics for various microwave applications.

本文言語English
ページ(範囲)800-803
ページ数4
ジャーナルJournal of the Korean Physical Society
63
3
DOI
出版ステータスPublished - 2013 8
外部発表はい

ASJC Scopus subject areas

  • 物理学および天文学(全般)

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