Methodology for evaluating operation temperatures of fin-type field-effect transistors connected by interconnect wires

Physics & Astronomy

• fins 100%
• methodology 67%
• field effect transistors 65%
• wire 62%
• thermal resistance 30%
• temperature 24%
• heat transmission 15%
• carbon nanotubes 11%
• temperature distribution 11%
• transistors 11%
• thermal conductivity 10%
• insulators 10%
• silicon 7%
• simulation 5%

Engineering & Materials Science

• Field effect transistors 89%
• Wire 62%
• Temperature 33%
• Heat resistance 28%
• Networks (circuits) 15%
• Carbon nanotubes 14%
• Hot Temperature 13%
• Thermal conductivity 12%
• Transistors 11%
• Temperature distribution 11%
• Silicon 10%
• Substrates 9%
• Heat transfer 9%